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Fries Research & Technology GmbH (FRT) offers a comprehensive range of metrological surface measuring systems for the non-destructive investigation of topography, profile, film thickness, roughness, abrasion and many other properties. More than 300 reputable international companies from the automotive, semiconductor, MEMS, optical, photovoltaic and many other industries equip their R&D and production departments with FRT metrology systems.
FRT operates from Bergisch Gladbach, Germany and maintains subsidiaries in China, Switzerland and the United States. Additionally, FRT provides a distribution and service network in the USA, Asia and Europe as well as a branch office in Munich.
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 Budget-friendly optical film thickness tool
The new MicroSpy FT non-destructively measures coatings that transparent or semi-transparent in the visible and near-infrared spectrum of light. The easy to use film thickness measuring tool is cost-effective and powerful at the same time. With its innovative 3D film thickness mapping mode, the tool allows the thickness measurement of entire coating. more... |
 Metrology for Frontend
(view product movie)
The measuring systems series MFE (metrology front end) is particularly suited to manufacturers of structured wafers, masks, MEMS and similar products. Because of the very high cleanliness, process and yield requirements, all tools are especially designed for use in cleanrooms. more... |
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 Metrology for the MEMS industry
MEMS
components have revolutionized today's products by making them safer
and adding exciting new features. MEMS mass production is based on
semiconductor production equipment – including non-contact,
high-resolution metrology tools for 2D and 3D wafer inspection from
FRT. (PDF, ca. 3.7 MB)
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 Metrology for the automotive industry
The
automotive industry is in new territory with the need to make precise
measurements. Product features are determined by deliberate structures,
surfaces and small component geometries that must be controlled. This
information need can be obtained by non-contact optical metrology.
(PDF, approx. 2.3 MB)
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 Metrology for the photovoltaic industry
the photovoltaic and solar industry are constantly seeking for improvements in effeciency and effectitivity for R&D, quality assurance and automated production control. This new leaflet about about metrology in photovoltaics presents typical applications and matching FRT instruments. (PDF, ca. 1.7 MB)
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 Metrology for the semiconductor industry
Download our new leaflet about wafer metrology. Learn about our standard systems and their appropriate applications in the semiconductor process. This leaflet is intended for wafer makers, semiconductor manufacturers and wafer reclaimers.
(PDF, approx. 2.3 MB)
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February 2009
Live Surface Investigation at Hannover Messe 2009: FRT offers test measurements at the industry's leading exhibition
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January 2009
FRT on Continued Growth Path: Market position tightend in several industries - Further expansion of service and distribution network in Europe, Asia and the US
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SEMICON West 2009, July 2009
SEMICON West is the flagship annual event for the global microelectronics industry—and much more.
No other event generates more industry "buzz" more...
24th EU PVSEC, September 2009
From 21st to 24th September 2009 the world's biggest Exhibition specialized in the sector of Photovoltaics will take place in Hamburg, more...
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The FRT Business Divisions
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FRT offers a broad range of measuring systems. You can choose between standardized system and custom systems to fit your individual need.
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FRT develops systems for process control which are specially designed to perform best within a given production process.
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FRT offers contract services for metrology measurements.
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