At each boundary layer of a transparent film incident light is partially reflected. To measure film thickness  with the CWL FT, light from a whitelight source (LED, Xenon or Halogen bulb) is focussed onto the film and the spectrum of the reflected light is evaluated. Due to the interference of the light from the boundary layers, the spectrum shows a typical waviness from which the sensor calculates the film thickness. Since the evaluated spectrum depends not only on the thickness, but also on the refractive index of the material, the parameter is included in the calculation of the thickness measurement.
	measurement of transparent films and coatings non-contact, non-destructive measurement small spot enables highly resolved measurements mapping in combination with MicroProf® or MicroGlider® systems small, wear-free sensor without moveable parts	Download Options   Product Sheet   Company Brochure
	measurement of foils in the food industry control of blister packaging thickness mapping on semiconducturs varnish measurement for the automotive industry examination of multilayer systems such as air gaps below transparent covers
	working distance 9 mm 26 mm light source  LED                             Halogen/Xenon  LED                             Halogen/Xenon measuring range 1 3 µm ... 180 µm          2 µm ... 250 µm 3 µm ... 180 µm          2 µm ... 250 µm resolution x,y < 5 µm < 20 µm measuring angle 90° ± 10° 90° ± 5 ° resolution film-thickness 10 nm wavelength range approx. 350 nm ... 850 nm  1 For refractive index of n=1 Technical specifications and content are subject to change.